Method of and apparatus for measuring the inside information of substance with the use of light scattering

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United States of America Patent

PATENT NO 5057695
SERIAL NO

07450980

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Abstract

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The present invention utilizes the difference of light reception data generated based on the difference in length of substantial optical diffusion paths between a single light receiving point and a plurality of irradiation points, or between a plurality of light receiving points and a single irradiation point. According to the present invention, the inside information of substance based on the difference in length of the optical diffusion paths, may be measured. Even though measurements are made under different measuring conditions as to the part to be measured, the measuring time, etc., there may be obtained reliable measured data of the inside information with good reproducibility.

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Patent Owner(s)

Patent OwnerAddress
OTSUKA ELECTRONICS CO LTD A CORP OF JAPAN26-3 SHODAI-TAJIKA 3-CHOME HIRAKATA-SHI OSAKA 573

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirao, Konomu Ibaraki, JP 17 577
Inamoto, Naoki Higashiosaka, JP 4 235

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