Field shift moire system
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United States of America Patent
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Dec 3, 1991
Grant Date -
N/A
app pub date -
Aug 8, 1990
filing date -
Aug 8, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus and method for providing high resolution non-contact absolute contour measurements of an object with moire interferometry. The invention utilizes a projection moire system in which the entire projection system is translated to perform a field shift. The field shift produces a phase shift that is proportional to the height of the object. A coarse three dimensional map of the surface is first obtained from the phase shift. This is combined with high resolution relative measurements of the phase to obtain an absolute Z map of the surface. The invention does not suffer from the 2.pi. ambiguity problem and is suitable for prismatic discontinuous structures. In addition, the present invention is applicable to industrial environments and requires a relatively inexpensive optical system. Further, the field shifting technique is applicable to fast parallel process computers thereby allowing for fast absolute contour generation of prismatic parts.
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