Method and apparatus for testing LCD panel array using a magnetic field sensor
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United States of America Patent
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Dec 17, 1991
Grant Date -
N/A
app pub date -
Jul 24, 1990
filing date -
Jul 24, 1990
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An LCD panel or the like is tested by determining whether any short circuit defects are present. The panel is tested for short circuit defects by scanning gate lines and drive lines with a magnetic field pickup device while a current is applied to a shorting bar which shorts together a plurality of gate lines or a plurality of drive lines. When a short circuit defect is present, a current flows through the shorted area. As a result, a corresponding magnetic field is generated along the involved lines. For a cross-short defect, the location of the defect is identified as the intersection of the drive line and gate line which generate magnetic fields of substantially the same strength.
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