Device for the dielectric characterization of samples made of a material having a flat or uneven surface and application for the non-destructive control of the dielectric homogeneity of said samples
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United States of America Patent
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Dec 31, 1991
Grant Date -
N/A
app pub date -
Sep 5, 1990
filing date -
Sep 5, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A device and method for the determination of the dielectric characteristics of a material sample. The device includes a probe (3) connected to a coaxial line (2) by a connector (30). The probe comprises a conductive tubular member (78) having a conductive rod (8) coaxial to the tubular member and centered on the latter. An annular member is made of a dielectric material is housed in the tubular member, and is integral with the rod. The annular member/rod assembly is slidably carried in the tubular part (7). A resistive force urges the probe in contact with the material sample (4) so that good contact is ensured with the material sample.
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