Atomic emission spectrometer with background compensation
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United States of America Patent
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Feb 11, 1992
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N/A
app pub date -
May 17, 1990
filing date -
Apr 9, 1988
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Abstract
A method of and a device for multi-element measurement of elements in a sample with correction for background emission. The method starts with atomizing a sample and then exciting the transformed atoms to emit light containing characteristic spectral lines for each element, followed by generating a spectrum of spectral lines characteristic of the elements, followed by measuring the intensity of selected spectral lines falling within a predetermined measuring range without changing their intensity. The next steps are sensing the background emission adjacent the selected spectral lines simultaneously with measuring the intensity of selected spectral lines and determining the concentration of each element from the measured intensity of the corresponding spectral line and sensed background emission.
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