Machine vision inspection system and method for transparent containers
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United States of America Patent
Stats
-
Mar 10, 1992
Grant Date -
N/A
app pub date -
Aug 30, 1990
filing date -
Aug 30, 1990
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A system and method for optical inspection of the bottom surfaces of transparent containers comprises an image acquiring means, an illumination source and means for processing, storing and analyzing the image to search for and identify a baffle mark in the acquired image, and when found, to remove or erase the baffle mark from the image memory prior to the defect inspection process. Significant defects present in the area of the image being searched can be identified, even if the defects are located directly on the baffle mark, thus providing high sensitivity capabilities for defect detection while maintaining a low false rejection rate due to baffle marks.
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