Testing asynchronous processes
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United States of America Patent
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Mar 17, 1992
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N/A
app pub date -
May 3, 1988
filing date -
May 3, 1988
priority date (Note) -
Expired
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Abstract
An asynchronous chip is tested functionally by clocking it at a rate slower than its specified rate while applying test vectors at times selected so that synchronized signals guaranteed on the chip will be predictable. Testing of the chip at the specified rate is accomplished on a section-by-section basis.
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