Thickness/density mesuring apparatus
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United States of America Patent
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Mar 24, 1992
Issued Date -
N/A
app pub date -
Apr 21, 1989
filing date -
Mar 31, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A low-voltage, compact measuring apparatus for measuring any one of thickness, density and denier of a material is disclosed which uses a PIN diode in conjunction with a low noise processing circuit to detect particle radiation emitted from a source, which source has its detection intensity affected by a material to be measured. A light blocking, particle radiation permeable material protects the PIN diode from detecting light radiation. A system for controlling the extrusion of a film using the measuring apparatus, and for correcting for erroneous measurement caused by web flutter, are also disclosed.
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