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Abstract

A pin electronics test circuit applies test signals at a pin of an ECL integrated circuit (IC) device under test (DUT) and senses and measures pin signals received from a pin of the DUT. The pin electronics test circuit incorporates test signal first and second electrical paths (TL1, TL2) (TL11, TL12) with respective test connect and disconnect first and second nodes (n1)(n2). First and second termination circuits (RL1, A1)(RL2,A2), first and second DC test signal generators (A1 etc.) (A2 etc.) for forcing DC test signal voltages and currents, AC test signal generator (I.sub.HI, I.sub.LO etc.) for switching between and driving AC test signals of high and low potential levels, and pin signal sensing and measuring circuits (CR1, 8CR2) are all contained on a single pin electronics card (PEC) (54) or formed as a single unit for a pin or complementary pair of pins of the DUT. Electronic switches including FET switches (S1,S3,S4,S5,S6,S7) and current sink switches (S2,S8,S9) permit rapid reconfiguration of the components of the pin electronic circuit with respect to the pair of test signal paths for testing in each of the different required testing modes for single ended, complementary output, and bus type ECL devices. The impedance discontinuities caused by electromechanical relays are eliminated permitting controlled impedance test signal paths. The pin electronics test circuit unit permits comprehensive testing including DC parameter tests, AC parameter tests, and AC or dynamic function tests.

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