Particle size analysis utilizing polarization intensity differential scattering
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United States of America Patent
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Apr 14, 1992
Issued Date -
N/A
app pub date -
Aug 31, 1990
filing date -
Mar 3, 1989
priority date (Note) -
Expired
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Abstract
Two arrangements are disclosed to provide high resolution measurement of sub-micrometer and micrometer particle size distributions. In a first arrangement, scattered light is measured over a wide range of scattering angles. At the same time, light scattered at low scattering angles is measured with high angular resolution. In the second arrangment, an improved Polarization Intensity Differential Scattering (PIDS) measurement is made possible by providing an interrogating light beam of selected wavelength including a first component having a linear polarization plane and a second component having a differential linear polarization plane, wherein the linear polarizations of the components are orthogonal. Photodetecting arrays in one or more scattering planes detect light scattered by the particles at least at two scattering angles.
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