Method and apparatus for correcting distortions in scanning tunneling microscope images
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United States of America Patent
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Apr 21, 1992
Grant Date -
N/A
app pub date -
Dec 26, 1990
filing date -
Dec 26, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A computer based image correction system for Scanning Tunneling Microscopes (STMs) caused by the non-linear, time-dependent behavior of piezoelectric transducers used in STMs to acquire the image. The correction process operates on a digitized stored STM image. A subset of the stored image scan lines are selected for processing. Each scan line is shifted and stretched according to the values of selected parameters. Adjacent scan lines are shifted and stretched in the direction the scan line was acquired. Adjacent scan lines are compared pixel by pixel and the differences are determined. The user is presented with a representation of the differences. The selected parameter values are varied until the differences between adjacent scan lines can best be minimized. The parameter values that best minimized the differences are then applied using the above process to the whole image. The result is an image with the distortions introduced by the piezoelectric transducers removed.
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