Testing apparatus

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United States of America Patent

PATENT NO 5109380
SERIAL NO

07329751

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Abstract

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A test apparatus for data processing and/or editing test data obtained from an object unit to be tested includes, in combination, an organization trade-off element; a failure mode and effect analysis list preparation element, a design review element consisting of a learning section, a knowledge base section and an inference section; a diagnosis rule preparation element; and a data diagnosis element consisting of a knowledge data base section and an inference function section.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI DENKI KABUSHIKI KAISHA A CORP OF JAPAN2-3 MARUNOUCHI 2-CHOME CHIYODA-KU TOKYO 100

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ogino, Toru Kanagawa, JP 6 149

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