Acoustic method and device for localization of defects in material
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United States of America Patent
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May 26, 1992
Grant Date -
N/A
app pub date -
Apr 23, 1990
filing date -
Apr 24, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The method according to the invention consists, in a first step, in studying the acoustic response of a piece P by recording, with acoustic sensors (1, 2, 3, 4), signals emitted by a calibrated acoustic emitter (5), from a succession of predetermined mark points defining a grid on the surface of the piece, while the latter is unstressed. In a second step, the piece is stressed and the acoustic signals coming from acoustic events created by this stressing of the piece are recorded. Processing of the propagation times and of the amplitudes of the acoustic waves thus recorded during these two steps allows identification of the position and size of structural defects in the material constituting the piece P.
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