EEG spatial placement and enhancement method

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United States of America Patent

PATENT NO 5119816
SERIAL NO

07578880

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Abstract

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An improved brain wave electroencephalograph (EEG) method measures the physical positions of EEG electrodes applied to the subject's scalp. A set of standard cross-directional lines are obtained to provide measurements of the subject's head and a computer system automatically defines the subject's head shape according to predetermined head shape classes. The position of the electrode on the subject's scalp is then determined by scaling the measurements of the subject's head to a head model of the same head shape class.

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Patent Owner(s)

Patent OwnerAddress
SAM TECHNOLOGY INC425 BUSH ST SAN FRANCISCO CA 94595

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gevins, Alan S San Francisco, CA 16 2144

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