Exposure method and apparatus

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United States of America Patent

PATENT NO 5121160
SERIAL NO

07715745

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Abstract

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An exposure method, includes the steps of directing a radiation beam to a substrate to be exposed; and substantially correcting any change in the size of the radiation beam. Also, there is disclosed an exposure apparatus, which includes a laser for emitting a laser beam; a detector for detecting any change in the size of the laser beam; and a device for directing the laser beam to a substrate to be exposed, the directing device including a compensator responsive to an output signal from the detector for substantially correcting the change in the beam size.

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Patent Owner(s)

Patent OwnerAddress
CANON KABUSHIKI KAISHAJAPAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aketagawa, Masato Yokohama, JP 7 283
Nakano, Hitoshi Kawasaki, JP 47 721
Sano, Naoto Kunitachi, JP 29 370
Shiozawa, Takahisa Yokohama, JP 22 860

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