Surface quality analyzer apparatus and method
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United States of America Patent
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Jun 16, 1992
Grant Date -
N/A
app pub date -
Sep 7, 1990
filing date -
Sep 7, 1990
priority date (Note) -
Expired
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Abstract
Method and apparatus for measuring the quality of a finished surface by projecting a pair of parallel light beams onto the surface and reflecting the beams alongside a reference beam onto an image screen where they are electronically recorded and analyzed against the reference image.
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