Method and apparatus for circuit board testing with controlled backdrive stress
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United States of America Patent
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Jun 30, 1992
Grant Date -
N/A
app pub date -
Aug 29, 1989
filing date -
Aug 29, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An automated circuit board testing system, for performing in-circuit, functional or cluster tests, takes backdrive stress into account in selecting appropriate isolation methods for digital devices during the design of the test protocol. In other words, the design of the test includes an analysis of the circuit board and its components, and of the available methods to isolate the device- or function-under-test from the rest of the circuit board. The analysis includes a calculation of stress currents on upstream components resulting from backdriving, and a selection of methods from those available which will produce stress currents below a pre-selected level. In another aspect of the invention, the safe maximum run-time for the test using the available methods is computed.
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