Importance

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Abstract

A method and an apparatus for guiding and collecting light which issues from a light source and which is passed in the form of an incident primary beam to a specimen or like material to be measured are intended to optimize guiding and collecting the light. That aim is achieved by a method wherein the material to be measured is disposed at a focus of a reflection surface formed at least as half an ellipsoid of revolution, and beams leaving said material are reflected at the reflection surface. In that connection, the primary beam is emitted directly in the center of the material to be measured. An apparatus of the kind set forth above is characterized in that at least the material (14) to be measured is surrounded by a reflection surface in the form at least of a half ellipsoid of revolution (13) and the material (14) to be measured is disposed at the focus (F1) thereof. In another apparatus, the measuring chamber (12) is defined by a reflection surface in the form of an ellipsoid (13) of revolution, the light source (3) being disposed at one focus thereof and the material to be measured being disposed at the other focus.

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First Claim