Particle measuring method and apparatus

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United States of America Patent

PATENT NO 5135306
SERIAL NO

07413538

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Abstract

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Disclosed is a particle measurement method and apparatus for measuring particle properties in which a laser beam is projected into a detection region in a medium containing particles to be measured, and a photoelectric detector having a predetermined dynamic range is used to detect the laser light scattered by the particles in the medium to produce signals which are evaluated to measure the particle properties. The polarization of the laser beam and the intensity of the scattered light are regulated in accordance with the range of particle sizes measured so that the intensity of the scattered light is within the dynamic range of the photoelectric detector. This arrangement makes it possible to expand the range of particle sizes with an improved resolving power in particle measurement without multi-valued ranges.

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Patent Owner(s)

Patent OwnerAddress
KOWA COMPANY LTD OF 6-29 NISHIKI 3-CHOME NAKA-KU NAGOYA-SHI AICHI-KEN 460 JAPANNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishikawa, Muneharu Ryuugasaki, JP 12 733
Kanebako, Makoto Tsukuba, JP 17 69

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