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Abstract

An internal bus test circuit for testing an integrated circuit internal bus which interconnects a plurality of function modules of the integrated circuit, the test circuit including switches that are operable for isolating respective modules from the bus, a bus setting circuit enabling individual lines to the bus to be set to a desired logic level, and a by-pass bus with corresponding by-pass circuits, for a function module that is connected between the bus and external pads. The test circuit thereby enables the bus functions to be easily tested in real-time operation, independently of the respective conditions of the test modules that are connected to the bus.

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