Apparatus and method for measuring weak, location-dependent and time-dependent magnetic fields

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United States of America Patent

PATENT NO 5152288
SERIAL NO

07774635

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Abstract

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An apparatus for measuring weak, location-dependent and time-dependent magnetic fields emitted from a source situated in an examination subject includes a sensor arrangement having at least ten gradiometers of the first order, each gradiometer being inductively coupled to a DC-SQUID. The sensor arrangement and the examination subject are disposed in a room which shields the examination subject and the sensor arrangement from magnetic fields. The room has a shielding factor of at least 10 for magnetic alternating fields having a frequency of 0.5 Hz, the shielding factor increasing with increasing frequency. A method for operating the apparatus is also disclosed.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS AKTIENGESELLSCHAFT80333 MÜNCHEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hoenig, Eckhardt Erlangen, DE 17 834
Reichenberger, Helmut Eckental, DE 32 1841
Schneider, Siegfried Erlangen, DE 68 1528

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