Serial scan diagnostics apparatus and method for a memory device
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United States of America Patent
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-
Oct 6, 1992
Grant Date -
N/A
app pub date -
Mar 29, 1990
filing date -
Mar 29, 1990
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A scan diagnostics apparatus and method is useful in connection with the memory integrated circuit. A shift register is provided which can receive data in parallel from the input register and output the data serially. The shift register can receive serial data and output in parallel either to the input buffer or the output buffer. Preferably the shift register can receive in parallel, data from the output buffer and output the data serially.
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