Enhanced radiative zone-melting recrystallization method and apparatus

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United States of America Patent

PATENT NO 5173271
SERIAL NO

07251558

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Abstract

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A method is provided for zone-melting-recrystallization (ZMR) to produce high quality substantially subboundary-free silicon-on-insulator (SOI) thin films by controlled radiant heating of the silicon film. Using this technique, a much wider experimental parameter range which improves the uniformity of the crystalline quality over the entire SOI film is possible.

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Patent Owner(s)

Patent OwnerAddress
MASSACHUSETTS INSTITUTE OF TECHNOLOGY A CORP OF MA77 MASSACHUSETTS AVENUE CAMBRIDGE MA 02139

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chenson K Weston, MA 6 130
Im, James Cambridge, MA 11 533

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