Three dimensional scanning system
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United States of America Patent
Stats
-
Dec 22, 1992
Grant Date -
N/A
app pub date -
May 20, 1991
filing date -
May 20, 1991
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A part scanning and part calibration apparatus and mechanism for the inspection of printed circuit boards and integrated circuits include a camera and two rotating mirrors to scan an image of a pattern mask retical upon which a precise pattern has been deposited. Small parts are placed upon the retical to be inspected. The third overhead mirror is provided to view the part under inspection from another perspective. The scene of the part is triangulated and the dimensions of the system can thus be calibrated. A precise retical mask is provided with dot patterns which provide an additional set of information needed for calibration. By scanning more then one dot pattern the missing state values can be resolved using an iterative trigonomic solution.
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Cited Art Landscape
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