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Abstract

Apparatus for reading bar codes on integrated circuit wafers during both the integrated circuit manufacturing process and the wafer manufacturing process which include placing a wafer in fixed position over a bar code scanner. The scanner includes a motor whose gearing moves a reader head in a linear raster pattern at a constant focal point over the bar code. The bar code scanner may be retrofitted to existing reading equipment used in the manufacture of the wafers or in the manufacture of the integrated circuits. In another aspect of the invention, the bar code scanner may be provided as part of a desk-top unit. The present invention is especially useful in reading bar codes in any situation where the bar codes are difficult to read because of varying print/contrast and reflectivity.

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First Claim