Reflectance measurement apparatus with noise reduction circuitry
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United States of America Patent
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Jan 5, 1993
Grant Date -
N/A
app pub date -
Feb 11, 1991
filing date -
Feb 11, 1991
priority date (Note) -
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Abstract
A reflectance meter having improved noise immunity for measuring photometric quantities is disclosed. The device includes noise reduction techniques for eliminating the effects of ambient and artificial light upon the measurement signal. A gated modulator provides frequency shifting of desired information to a carrier frequency so that undesired signals may be filtered out. A gated demodulator provides a means to demodulate the information contained in frequency spectrum near the gate or chopping frequency.
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