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Abstract

An atomic absorption spectrometer contains a line-emitting first light source (16), an official system (20, 22, 28, 30, 34) for generating a measuring light beam (18) which passes through a test sample space (12) and impinges on a photoelectric detector (38). An atomization device (14) for atomizing a test sample is so arranged in the test sample space that the constituents of the test sample are present in atomic form in an atomization region traversed by the measuring light beam (18). A light beam (72) is emitted continuously by a second light source (70). A beam splitter (74) reflects the light beam from the second light source (70) as a reference beam into the optical path of the measuring light beam (18). The two light sources (16, 70) can be switched on alternately by switching means. The beam splitter (74) can be removed optionally from the optical path. In addition, an electromagnet (44) generates a magnetic field aligned with the measuring light beam (18) at the site of the atomized test sample for optional background measurement by means of the longitudinal Zeeman effect.

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