Measurement method for the determination of low levels of optical absorption

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United States of America Patent

PATENT NO 5185645
SERIAL NO

07659008

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Abstract

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A measurement method is presented for the determination of low levels of optical absorption in any material, with at least a quasi-simultaneous detection of the transmission intensities of a measurement light beam and a reference light beam, the wavelengths of which are different, such that, essentially, the measurement light is absorbed by the material to be tested, and with a joint analog acquisition of the detected measurement and reference signals, taking into consideration the natural difference in intensities between the measurement light beam and the reference light beam.

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Patent Owner(s)

Patent OwnerAddress
HEINRICH-HERTZ-INSTITUT FUR NACHRICHTENTECHNIK BERLIN GMBHBERLIN FEDERAL REPUBLIC OF GERMANY BERLIN BERLIN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huet, Bertrand - 2 33
Reboux, Alain - 4 42
Sartorius, Bernd Berlin, DE 22 145

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