Two-beam interferometer apparatus and method, and spectrometer utilizing the same
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United States of America Patent
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Mar 23, 1993
Grant Date -
N/A
app pub date -
Oct 9, 1991
filing date -
Oct 9, 1991
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A two-beam interferometer for Fourier spectroscopy comprises one or two reflecting channels, each having at least one relatively movable wall to vary the path length of a beam traversing the same. A beam passing through the channel makes multiple reflections therewithin, impinges upon a retroreflector, and is transferred back through the channel along the same path to recombine with a second beam, which can be similarly reflected. The multiple reflections that occur within the channel allow a large total path length change to be accomplished with a small degree of motion of the movable wall, to thereby achieve high levels of resolution.
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