Method and apparatus for atomic imaging

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United States of America Patent

PATENT NO 5200618
SERIAL NO

07490847

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Abstract

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A method and apparatus for three dimensional imaging of the atomic environment of disordered adsorbate atoms are disclosed. The method includes detecting and measuring the intensity of a diffuse low energy electron diffraction pattern formed by directing a beam of low energy electrons against the surface of a crystal. Data corresponding to reconstructed amplitudes of a wave form is generated by operating on the intensity data. The data corresponding to the reconstructed amplitudes is capable of being displayed as a three dimensional image of an adsorbate atom. The apparatus includes a source of a beam of low energy electrons and a detector for detecting the intensity distribution of a DLEED pattern formed at the detector when the beam of low energy electrons is directed onto the surface of a crystal. A device responsive to the intensity distribution generates a signal corresponding to the distribution which represents a reconstructed amplitude of a wave form and is capable of being converted into a three dimensional image of the atomic environment of an adsorbate atom on the crystal surface.

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Patent Owner(s)

Patent OwnerAddress
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEMPOST OFFICE BOX 340 MILWAUKEE WI 53211

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
de, Andres Rodriquez Pedro L Madrid, ES 1 2
Saldin, Dilano K Milwaukee, WI 2 5

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