Method of processing semiconductor wafers using a contact etch stop

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United States of America Patent

PATENT NO 5206187
SERIAL NO

07812063

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Abstract

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A method of processing a semiconductor wafer comprises: a) fabricating a wafer to define a plurality of conductively doped active regions, the active regions having outwardly exposed surfaces positioned at varying elevations of the wafer; b) providing a layer of transition metal oxide elevationally above the active regions; c) applying an insulating dielectric layer elevationally above the transition metal oxide layer; d) etching selected portions of the insulating dielectric layer over different elevation active areas using an etch chemistry which is highly selective to the transition metal oxide and using the transition metal oxide as an effective etch stop enabling etching of the insulating dielectric layer in a single etch step to adjacent selected active regions which are at different elevations; and e) etching the transition metal oxide from the selected portions and upwardly exposing selected active regions.

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Patent Owner(s)

Patent OwnerAddress
MICRON TECHNOLOGY INC A CORPORATION OF DE2805 E COLUMBIA ROAD BOISE ID 83706

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Doan, Trung T Boise, ID 253 14083
Sandhu, Gurtej S Boise, ID 1223 33846

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