Method and apparatus for optically measuring the thickness of a coating

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United States of America Patent

PATENT NO 5208645
SERIAL NO

07641784

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Abstract

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A method and an apparatus for measuring the thickness of a coating provided around a cylindrical object such as an optical fiber optically. The cylindrical object is irradiated by a measuring light and the light derived from the object is received by a photo-detector so that the intensity of the derived light is measured to thereby detect the thickness of the coating.

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Patent Owner(s)

  • SUMITOMO ELECTRIC INDUSTRIES, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aikawa, Haruhiko Kanagawa, JP 21 180
Inoue, Akira Kanagawa, JP 485 5480
Ishiguro, Yoichi Kanagawa, JP 36 386

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