Detection mark and method and apparatus for detecting mark

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United States of America Patent

PATENT NO 5210411
SERIAL NO

07722186

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Abstract

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A detection mark comprising a pattern formed from a thin phosphor layer which emits a light having a different wavelength from that of an excitation light irradiated on a surface side of the phosphor layer, and an undercoat layer which is formed on a rear surface side of the phosphor layer and reflects the excitation light, which mark can be detected by intermittently irradiating the excitation light to the mark and reading a light or afterglow from the phosphor layer.

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Patent Owner(s)

Patent OwnerAddress
HITACHI MAXELL LTD1-88 USHITORA 1-CHOME IBARAKI-SHI OSAKA 5678567 ?5678567

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishida, Masato Kyoto, JP 12 145
Ohiwa, Tsunemi Osaka, JP 11 559
Oshima, Toshio Osaka, JP 28 529
Yamaguchi, Tsutomu Takatsuki, JP 96 924

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