Penetrameter and method of use
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United States of America Patent
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May 11, 1993
Grant Date -
N/A
app pub date -
Jun 3, 1992
filing date -
Jun 3, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A penetrameter is provided for use in evaluating the resolution of an x-ray inspection system as well a method for calibrating the resolution of the x-ray inspection system. The penetrameter comprises a radiolucent substrate, and at least one filament at the radiolucent substrate, the at least one filament being broken by a gap having a predetermined size. The method of determining the resolution of an x-ray inspection system comprises steps of: generating a radiographic image of the penetrameter, determining if the broken filament is visible, and if the broken filament is visible, determining if the gap is visible.
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