Dual radiation targeting system

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United States of America Patent

PATENT NO 5212720
SERIAL NO

07827672

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Abstract

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Subsurface regions of an X-ray transparent but optically opaque object are targeted along a visible line of sight obtained by the use of two radiation sources (an X-ray and light beam source, preferably a laser). The central ray from the X-ray source and the light beam are aligned using a calibration fixture, one to the other and both with respect to structures internal to the object being imaged to provide the visible line of sight. The system (method and apparatus) may be used in surgical applications for selective illumination and sighting to reach specific subsurface members of a patients anatomy by guiding an incision.

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Patent Owner(s)

Patent OwnerAddress
RESEARCH FOUNDATION OF THE STATE UNIVERSITY OF NEW YORK THESUITE 200 UB COMMONS AMHERST NY 14228

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Landi, Michael K Snyder, NY 7 483
Lifeso, Robert M East Amherst, NY 2 268

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