Dual level test fixture
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United States of America Patent
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-
May 25, 1993
Grant Date -
N/A
app pub date -
Dec 12, 1991
filing date -
Dec 12, 1991
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test fixture with a single vacuum well and two vacuum chambers for use in the automatic testing of printed circuit boards is connected to an electronic circuit tester for performing high speed testing of circuits on the board. The fixture includes a vacuum well, two vacuum chambers formed by gaskets, a movable top plate for moving the circuit board and a stripper plate between two positions, and ar array of test probes disposed in the vacuum well for access to the circuit board. The board under test is placed on the test fixture and a first vacuum is drawn from the first vacuum chamber to move the plate, thereby engaging a first plurality of test probes with the board for performing functional tests. A second vacuum is drawn from the second vacuum chamber to move the printed circuit board to engage a second set of test probes. A second set of electrical test signals is communicated to both sets of test probes for a second in-circuit test.
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