Method and apparatus for self-testing a transducer system
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United States of America Patent
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Jun 15, 1993
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N/A
app pub date -
Dec 28, 1990
filing date -
Dec 28, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for self-testing a transducer system. A signal generator is used to generate a predetermined sequence of signals or pulses, and the sequence has a finite test-time duration. The self-test signal also has the properties that its time varying part: (1) sums to zero over the test time interval; and (2) it has a relatively flat frequency spectrum. Additionally, calculations are made even simpler if the self-test signal is chosen to switch at pseudo random intervals between two fixed values. The output of the self-test system has one term which is directly proportional to the transducer system sensitivity and represents the desired self-test result, and one or more error terms which tend toward zero as the test-time duration increases. The self-testing system of the present invention may be implemented either in analog circuitry, digital logic, or a combination thereof. Preferably the transducer system is operatively disposed on an integrated circuit chip, and self-testing system of the present invention is similarly situated on the same integrated circuit chip.
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