Test system with reduced test contact interface resistance

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United States of America Patent

PATENT NO 5221905
SERIAL NO

07843050

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Abstract

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An improved test system includes means for generating a contact wetting pulse and applying the contact wetting pulse to a network such that contact resistance at the interfaces between probes of the test system and terminals of the network is effectively lowered.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATION A NY CORPARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bhangu, Labh S Hopewell Junction, NY 1 60
Morrison, Thomas Pleasant Valley, NY 19 356
Probst, Klaus Herrenberg, DE 5 175

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