Method for diagnosing abnormality of sensor
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United States of America Patent
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Aug 10, 1993
Issued Date -
N/A
app pub date -
Nov 10, 1992
filing date -
Feb 9, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
There is provided a method for diagnosing an abnormal state of a sensor having a nonlinear output characteristic in which an output signal of a sensor changes nonlinearly. The method includes the steps of determining a first detection value which is indicated by the output signal of the sensor at a predetermined time, and determining a second detection value which is indicated by the output signal of the sensor obtained when a detection value indicated by the output signal has changed by a predetermined variation from the first detection value. The method also includes judging whether or not a deviation between the first detection value and the second detection value is out of a predetermined range, and determining that the sensor has an abnormal state when it is determined that the deviation is out of the predetermined range.
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