Laser systems for food analysis based on reflectance ratio detection
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United States of America Patent
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Aug 24, 1993
Issued Date -
N/A
app pub date -
Aug 13, 1992
filing date -
Feb 2, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Systems and methods for material analysis are disclosed in which a material (e.g., a food of food ingredient) is illuminated at a plurality of discrete wavelengths. Measurements of the intensity of reflected light at such wavelengths are taken, and a analysis of reflection ratios for various wavelengths is performed. Changes in the reflection ratios are correlated with specific material properties such as the concentration of analytes or the condition of the material (e.g., spoilage, ripeness, degree of cooking or other processing stages).
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