Method and apparatus for process control with opimum setpoint determination
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United States of America Patent
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Aug 24, 1993
Issued Date -
N/A
app pub date -
Dec 12, 1990
filing date -
Jul 30, 1990
priority date (Note) -
Expired
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Abstract
An improved setpoint control system is disclosed for use in conjunction with process control equipment. The system generates signals representing a statistical characteristic of batches, or subgroups, of monitored values of a controlled variable. From these statistical characteristic signals, the system generates an optimum setpoint signal as a sum of a specification limit and a scaled value of the standard deviation of averages of each of a plurality of batches controlled variable values.
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