Integrated quality control method and system

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United States of America Patent

PATENT NO 5245554
SERIAL NO

07672112

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Abstract

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An integrated quality control method and system for explaining failure causes of a product. Information relating to failure of the product and measures taken to correct the failure as well as information relation to manufacture and distribution of the product are collected and inputted for storage in a data base. The information relating to the failure and measures taken to correct the failure is combined with the information relating to the manufacture and distribution of the product and the combined information is analyzed for enabling an estimate of causes of the failure of the product and a trend of possible failures.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO 100-8280

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Harada, Toshimasa Kanagawa, JP 2 114
Higano, Koichi Tochigi, JP 2 114
Izui, Kozo Tochigi, JP 1 25
Namiki, Toshio Tochigi, JP 2 114
Shimoyashiro, Sadao Kanagawa, JP 15 471
Tsuyama, Tsutomu Kanagawa, JP 6 160
Yamaguchi, Chikaaki Tochigi, JP 2 114

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