Measuring instrument and measuring method for identifying properties of a specimen with matched dual source calibration
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 21, 1993
Grant Date -
N/A
app pub date -
Sep 18, 1992
filing date -
Sep 20, 1991
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A measuring instrument and a method of measuring including providing an illumination arrangement having a plurality of independent illumination sources, a specimen region for conducting a specimen illuminated by the illumination arrangement, a measuring arrangement detecting radiation influenced by the specimen in the specimen region, the illumination arrangement having a plurality of independent aluminum sources which are energized by separate leads and separate switch elements that are operable to selectively operate either individually or in common for a linearity check.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully