Method of matching patterns and apparatus therefor

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United States of America Patent

PATENT NO 5253306
SERIAL NO

07636127

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Abstract

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A method for matching patterns includes the steps of optically scanning a master image and a to-be-recognized image and outputting master image data and to-be-recognized image data, extracting master outline data representing an outline of the master image from the master image data, extracting to-be-recognized outline data representing an outline of a to-be-recognized image from the to-be-recognized image data, performing an enlargement process for the to-be-recognized outline data to enlarge the to-be-recognized outline, thereby forming to-be-recognized outline data, and collating the master outline data with the to-be-recognized outline data, and if a portion of the master outline projects from the to-be-recognized outline, determining that the to-be-recognized image has a short-defect indicating an omission of the image

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Patent Owner(s)

Patent OwnerAddress
FUTEC INC A CORP OF JAPAN1217 HAYASHI-CHO TAKAMATSU-SHI KAGAWA-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishio, Masami Kagawa, JP 2 96

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