Importance

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Abstract

A dual side access test fixture tests circuits on both sides of a printed circuit board. The fixture includes a housing, a lower probe plate in the housing, an array of lower test probes in the lower probe plate for contacting the bottom of the board, an upper probe plate on the housing for moving to a closed position above the board, and an array of upper test probes in the upper probe plate for contacting an upper surface of the board when the upper probe plate closed. A plurality of system interface pins in the housing are electrically connected to the lower test probes. An external upper interface connector mounted over the closed upper probe plate has a plurality of contacts for connection to corresponding upper test probes. Flex cables contained within the upper interface connector conduct test signals from the upper test probes directly to an external electronic circuit tester. A first set of test signals is communicated from the lower test probes through the interface pins to the circuit tester. Separately, a second set of test signals is communicated from the upper test probes through contacts in the upper interface connector to the flex cables and to the circuit tester, via direct electrical connections which circumvent electrical feed-through connections within the interior of the vacuum fixture housing.

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First Claim