Wafer probing test machine
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 11, 1994
Grant Date -
N/A
app pub date -
Feb 19, 1992
filing date -
Feb 19, 1991
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A wafer probing test machine including a loading/unloading section defined by a first frame to enclose plurality of cassette stages therein, a test section defined by a second frame for enclosing a test stage therein, an elevator for moving at least one of the cassette stages up and down, and a wafer transfer system having a multi-jointed arm for taking out the wafer from a cassette and transferring the wafer onto the test stage.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully