Method and apparatus for contamination control in processing apparatus containing voltage driven electrode

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United States of America Patent

PATENT NO 5298720
SERIAL NO

07514916

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Abstract

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A process chamber having voltage driven electrodes, e.g. plasma chamber, can be made self cleaning of particle contamination by appropriate design of the workpiece or electrode surface to provide protuberances, grooves or tapers thereon which result in a predetermined pattern in the electrostatic potential within the process chamber which can trap particulate contamination in preselected regions within the plasma chamber. These particles can then be channeled out of the process chamber through a pump port.

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Patent Owner(s)

Patent OwnerAddress
IBM CORPORATION1101 KITCHAWAN ROAD OFFICE 36-238C YORKTOWN HEIGHTS NY 10598

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cuomo, Jerome J Lincolndale, NY 69 2924
Grazioso, Michael V Wappingers Falls, NY 5 96
Guarnieri, Charles R Somers, NY 6 795
Haller, Kurt L Peekskill, NY 10 143
Heidenreich, III John E Yorktown Heights, NY 7 76
Selwyn, Gary S Hopewell Junction, NY 37 811
Whitehair, Stanley J Peekskill, NY 7 530

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