Mass spectrometer
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United States of America Patent
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Mar 29, 1994
Grant Date -
N/A
app pub date -
Feb 2, 1993
filing date -
Feb 4, 1992
priority date (Note) -
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Abstract
Ions generated by an ES ion supply are introduced into a mass spectrometer portion through a small hole in a second electrode after passing through a small hole in a heated first electrode, and are analyzed by a mass spectrometer. Corresponding to heating of the first electrode, a length of the small hole in the first electrode is determined to a predetermined adequate value.
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