Desk top spectrum analyzer
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United States of America Patent
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Mar 29, 1994
Grant Date -
N/A
app pub date -
Aug 9, 1991
filing date -
Aug 9, 1991
priority date (Note) -
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status (Latency Note)
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Abstract
A control system emulates an X-ray spectrum generation and analyzing system on a computer by emulating the experimental apparatus, emulating the experimental geometry between elements of the experimental apparatus and emulating a material sample within the experimental apparatus including the emulated material sample's physical properties. The control system allows an operator generate theoretical spectra of material samples based on the emulated experimental apparatus and the physical characteristics of the emulated material sample. The control system also allows the operator to compare the generated theoretical spectrum to a real spectrum acquired from the experimental system and sample which have been emulated. Thus, the operator can easily determine the sufficiency of the emulation of the experimental set-up. The control system further allows the operator to analyze the generated theoretical spectra. Thus, the operator can determine the sufficiency of the experimental set-up in determining the character and composition of the real material sample.
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