Non-hydrogenous process level measurement
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United States of America Patent
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Apr 5, 1994
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N/A
app pub date -
Dec 9, 1991
filing date -
Dec 9, 1991
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Abstract
A process measurement system that utilizes fast neutron backscattering for measuring density, level, and interfaces of substantially non-hydrogenous materials. The present invention substantially expands the use of backscattering technology, by expanding measurement to materials other than those containing hydrogen, and allowing measurement of materials in thicker walled vessels than previously possible. The system contains a fast neutron source for emitting neutrons into the material to be measured. The detection system is mounted near the neutron source to receive the backscattered neutrons. An energy degradation system is also incorporated to reduce the energy level of the fast neutrons down to a desired range.
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